IP PortfolioPhysical IPtest structures and process monitors
of_crack_detect
Die crack and moisture detector
Maturity plannedTargets ASIC (CMOS) onlyDifficulty EasyPriority 2
Continuity loop just inside the seal ring with a readout cell that detects die cracking and edge delamination after dicing and in field.
Planned. This block is specified in the catalog with its interfaces and targets. No implementation exists yet; the skeleton command below generates a lint-clean shell with its ports and registers.
Interfaces
| Port | Direction | Kind | Width | Notes |
|---|---|---|---|---|
| loop | inout | analog | 2 | |
| fail | out | parallel | 1 |
Standards
No external standard applies.
More in test structures and process monitors
| ID | Block | Maturity |
|---|---|---|
| of_matching_arrays | Device matching test arrays | planned |
| of_pcm_si | Silicon process control monitor set | planned |
| of_ring_osc | Ring oscillator process monitor | planned |
| of_rel_struct | Reliability test structures | planned |
| of_sram_yield | SRAM yield and bitmap test vehicle | planned |
| of_thermal_test | Thermal test structures | planned |