IP PortfolioPhysical IPdie marking, alignment and finishing
of_align_marks
Lithography alignment and overlay marks
Maturity plannedTargets ASIC (CMOS) onlyDifficulty EasyPriority 1
Alignment keys, vernier and box-in-box overlay targets and CD bars for each mask layer, placed in scribe and in-die.
Planned. This block is specified in the catalog with its interfaces and targets. No implementation exists yet; the skeleton command below generates a lint-clean shell with its ports and registers.
Interfaces
No external interfaces are defined for this entry yet.
Standards
No external standard applies.
More in die marking, alignment and finishing
| ID | Block | Maturity |
|---|---|---|
| of_seal_ring | Seal ring | planned |
| of_die_mark | Die marking and logo cells | planned |
| of_chip_id_rom | Metal-programmable chip ID cell | planned |
| of_fill_gen | Density fill generator | planned |