IP PortfolioAnalog and mixed-signalsensors_monitors
of_ams_aging_monitor
Aging and degradation monitor
Maturity plannedTargets ASIC (CMOS) onlyDifficulty MediumPriority 2
Stressed versus reference ring oscillator pairs that measure BTI and HCI induced delay shift over product lifetime.
Planned. This block is specified in the catalog with its interfaces and targets. No implementation exists yet; the skeleton command below generates a lint-clean shell with its ports and registers.
Interfaces
| Port | Direction | Kind | Width | Notes |
|---|---|---|---|---|
| ctrl | in/out | APB control bus | 32 | Control and status registers, including ID, VERSION and STATUS |
| irq | out | interrupt | 1 | Interrupt request |
| delta | out | valid-qualified bus | 16 |
Standards
- ISO 26262
More in sensors_monitors
| ID | Block | Maturity |
|---|---|---|
| of_ams_temp_sensor | On-die temperature sensor | planned |
| of_ams_temp_sensor_remote | Remote diode temperature sensor | planned |
| of_ams_process_monitor | Process monitor | planned |
| of_ams_droop_detector | Supply droop detector | planned |
| of_ams_vmon_adc | Distributed voltage monitor | planned |
| of_ams_csa | Current sense amplifier | planned |
| of_ams_glitch_detector | Clock and voltage glitch detector | planned |
| of_ams_light_sensor_afe | Ambient light sensor front end | planned |
| of_ams_hall_afe | Hall sensor front end | planned |
| of_ams_gas_sensor_afe | Electrochemical gas sensor potentiostat | planned |